Analyzing Visual Defects Using FTIR Microspectroscopy

Determining the true identity, and likewise the source, is key to solving the problem. The faster the material is identified, the faster the source of the defect is found.

In this application note, the author demonstrates the capabilities of the SurveyIR, a powerful FTIR Microanalysis Accessory manufactured by Czitek. The SurveyIR FTIR Microanalysis Accessory is an exciting new accessory that offers ease-of-use features at an affordable price.

It combines superior visual clarity and unique illumination options with simple camera controls. This allows the sample to be found quickly with precision, and enables the collection of the infrared spectrum of the exact spot to identify it accurately.

The SurveyIR can upgrade nearly any FTIR to create a solution for defect or failure analysis, art conservation, archeology or forensic analysis problems. The system is compact and easy to install, which makes it ideal for use in the lab or in the field. Unique features, including oblique illumination and view through ATR bring together the optimum visual quality with confidence in the chemical identification, making the SurveyIR an invaluable tool